|
![[Under Construction]](images/undercon.gif)
NAVIGATION
MENU
| |
Under Construction
Expert Technical Approach Provided to the Property Loss Professional
- First -hand experience with high-tech semiconductor & optical device
fabrication technologies.
- Experienced in the evaluation of environments suitable for electronic
and photonic equipment.
- Real experience with hardware disaster and recovery involving various
forms of contamination including floods, fire, smoke, particulates, and
ionic contamination.
- Successful investigation of property loss due to malicious activities.
- Provided expert witness testimony in Federal Court involving
contamination of electronic equipment.
- Investigative assessments - Even years after an event to determine scope of
event related damage and value of the loss using historical records,
interviews, etc.
- Analytical investigation - When required, high-tech investigative
techniques are utilized on our projects to determine cause, impact, and
resolution.
- Documentation - We can provide assistance documenting the loss and
providing post-loss claims management support.
Ability to Succeed
When determined as necessary, various analytical techniques have been
employed for successful resolution of property losses. Analytical
techniques have been utilized for an array of property losses, eg fire, flood,
contamination, and malicious activity. Analytical techniques utilized
include:
- Scanning Electron MIcroscopy (SEM)
- Energy Dispersive X-Ray Spectroscopy (EDS)
- X-Ray Fluorescence (XRF)
- Ion Chromatography (IC)
- Gas Chromatography/Mass Spectrometer (GC/MS)
|